The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 1992

Filed:

Nov. 30, 1990
Applicant:
Inventors:

Walter J Belmore, III, Spring, TX (US);

Raymond G Basinger, Spring, TX (US);

Assignee:

Compaq Computer Corporation, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 725 ; 3241 / ;
Abstract

A top-accessible system for simultaneously testing both sides of a printed circuit board includes a vertically movable top plate, upon which the circuit board may be rested, and a framed bottom plate which underlies the top plate and defines a vacuum chamber therewith. A mounting plate is pivoted to the upper side of the top plate for movement to a latched test position over the circuit board. A probe plate is movably carried by and is parallel to the underside of the mounting plate. With the mounting plate in its test position a cam structure thereon is operated to drive the probe plate transversely toward the circuit board to cause upper test pins on the probe plate to perpendicularly contact test points on the upper side of the circuit board, and cause hold-down members on the probe plate to contact the circuit board and firmly hold it against the top plate. The vacuum chamber is then evacuated to draw the top plate toward the bottom plate and cause lower test pins on the bottom plate to move upwardly through openings on the top plate and engage test contact points on the underside of the circuit board. The top ends of the upper test pins are conveniently accessible through a mounting plate opening, and cross-over circuitry is provided which routes the test pin output signals from both the top and bottom sides of the circuit board to beneath the bottom plate.


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