The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 1992

Filed:

Apr. 20, 1990
Applicant:
Inventors:

Anthony G Dewey, San Jose, CA (US);

Wilfried Lenth, Santa Cruz, CA (US);

Daniel Rugar, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G11B / ;
U.S. Cl.
CPC ...
359640 ; 359618 ; 359837 ; 369 4414 ; 369 4423 ;
Abstract

An apparatus and method is described for detecting focus errors in an optical head by positioning a prism in the optical path of a return light beam reflected from an optical recording medium. The prism reduces the beam in one dimension by a factor of M and concurrently increases the divergence/convergence angle associated with a focus-error of the beam by a factor of M in this dimension, thereby desirably enhancing the focus error signal by a factor of M.sup.2. A focus error is detected by a segmented photodetector having inner and outer photosensitive regions. The photodetector generates an electrical signal indicative of the focus error from the difference in light intensities at the inner and outer regions. The photodetector preferably is segmented in such manner as to also provide a track error signal.


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