The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 1992

Filed:

Mar. 22, 1990
Applicant:
Inventor:

James D Hill, Mt. Airy, MD (US);

Assignee:

Tandem Scanning Corporation, Reston, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
359234 ;
Abstract

Improvements in optical scanning disks, and methods to maximize resolution and contrast of a viewed target object featuring a Nipkow type disk and methods to produce the disk which has a multitude of pinhole apertures located in a defined annular disk region where each pinhole is equidistantly spaced from its nearest neighboring holes.


Find Patent Forward Citations

Hill, James. (1992). Scanning disks for use in tandem scanning reflected light microscopes (U.S. Patent No. 5083220). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5083220

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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