The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 1992
Filed:
May. 30, 1991
Stephen C Corona, Rochester, NY (US);
George A Charnitski, Fairport, NY (US);
Richard F Lehman, Nashua, NH (US);
Charles J Urso, Webster, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
A test procedure is provided for obtaining optimum illumination exposure in a document scanning an exposure system. A document illumination lamp is energized and reflection images from a document platen is transmitted through an optical system onto a linear photosensor array which is positioned in the normal exposure (image) plane. The array outputs, corresponding to individual photodiodes outputs, are amplified and processed under the control of a computer controlled software program to provide a real time display of the illumination characteristics on a display screen. The screen, in one embodiment, displays a colored bar graph which is superimposed against the horizontal line representing an in specification illumination level. The lamp and, or, illuminator, is repositioned while observing the bar graph until an optimum bar graph value is measured below the specification line. Other displays are provided to monitor and adjust performance of an infrared densitometer and to adjust the gain of the individual photodiodes which form the photosensitive array.