The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 1992

Filed:

Feb. 07, 1990
Applicant:
Inventors:

Kiyotaka Imai, Tokyo, JP;

Hiroharu Kato, Tokyo, JP;

Tadaaki Hattori, Tokyo, JP;

Katsuyuki Nishifuji, Tokyo, JP;

Assignee:

NKK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 45 ; 378 44 ; 378 48 ; 378 53 ;
Abstract

The plating amount and composition of a plated steel plate are measured by determining a theoretical relation for an intensity at two different light-receiving angles of K-series fluorescent X-rays of analysis target elements reflected by the plate when monochromatized X-rays are radiated onto the plate at two incident angles, measuring a fluorescent X-ray intensity by using standard samples having known plating amounts and compositions, under the same conditions as for obtaining the theoretical relation, and calculating a conversion coefficient for converting the measured value into a theoretical value by the theoretical relation, measuring a fluorescent X-ray intensity obtained from a plated steel plate to be measured having unknown plating amount and composition under the same conditions for obtaining the theoretical relation, and converting the measured fluorescent X-ray intensity into a theoretical intensity by using the conversion coefficient, and calculating a plating amount and composition as parameters in the theoretical relation, which minimize a difference between the theoretical intensity obtained by the theoretical relation and the converted theoretical intensity, as a plating amount and composition of the plate to be measured.


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