The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 1992
Filed:
Mar. 31, 1989
Kenneth F Koral, Ann Arbor, MI (US);
W Leslie Rogers, Ann Arbor, MI (US);
Neal H Clinthorne, Ann Arbor, MI (US);
Xiaohan Wang, Ann Arbor, MI (US);
The University of Michigan, Ann Arbor, MI (US);
Abstract
A system for removing the effects of Compton scattering in systems such as tomographic scanning and radioisotope imaging arrangements, which detect gamma rays, utilizes the smoothness of the Compton component over the image to reduce computing time. Data responsive to energy states of the photons which are detected are received and values corresponding thereto are stored in at least one memory location. In some embodiments, where imaging is the ultimate function of the gamma ray detection system, the data correspond to predetermined image grid points. Also, the data which is stored is processed so as to be separated into a first data set corresponding to unscattered ones of the detected photons and a second data set corresponding to scattered ones of the detected photons. The gamma ray detection arrangement is calibrated by acquiring a spectral shape corresponding to unscattered photons. The processing utilizes non-linear least squares fitting analysis. The first data set is summed within specified limits, for determining a number of the unscattered ones of the detected photons. A scatter-free image can then be formed from this data set.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile