The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 1992
Filed:
Aug. 28, 1990
Toshimasa Hashimoto, Tokyo, JP;
Akira Miyamoto, Zushi, JP;
Kohei Shizuka, Yokohama, JP;
Teruo Hyugaji, Yokohama, JP;
Mitsui Toatsu Chemicals, Inc., Tokyo, JP;
Abstract
Disclosed is a method for measuring the thermal diffusivity in the thickness direction of a thin sample plate, which has the steps of forming a conductive thin layer on at least one surface of said thin sample plate to allow the thin film to function as an ac heater generating joule heat, applying an ac current modulated with a given modulation frequency to the ac heater (conductive thin layer) so as to produce ac joule-heating, generating an oscillation response corresponding to said ac joule-heating on the opposite surface of the ac heater, and measuring the phase shift between said oscillation response, and the ac joule-heating, thereby obtaining the thermal diffusivity in the thickness direction of said sample plate. Apparatus useful for the method are also disclosed.