The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 1992

Filed:

Jun. 25, 1990
Applicant:
Inventor:

Sidney D Miller, Mountain View, CA (US);

Assignee:

Ampex Corporation, Redwood City, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250561 ;
Abstract

In a head displacement measuring apparatus, a folded optical path is used to introduce a collimated beam of light from a light source to a split photo detector, wherein both the light source and the split photo detector are mounted external of the support housing which secures and supports the flexible head assembly. A pair of optical prisms direct the light beam parallel to a head supporting blade integral with the head assembly. A Fresnel lens secured to the blade, preferably at the head end, varies the position of the path of the light beam in response to lateral displacement of the blade and head, to likewise vary the extent that the beam impinges one or the other of the photo detectors. The difference of the signals from the split photo detector provides a precise measurement of the transverse displacement of the head from a nominal centered position.


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