The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 1992
Filed:
Feb. 05, 1990
Roeland M Hekker, Fairfield, IA (US);
Izhak M Livny, Fairfield, IA (US);
Terence M Haran, Fairfield, IA (US);
Robert D Buck, Fairfield, IA (US);
E. I. Du Pont de Nemours and Company, Wilmington, DE (US);
Abstract
The conformance of an unknown object to predetermined characteristics is evaluated through a characteristic signature, using its transform image. The presence at an inspection station of each successive one of the objects to be inspected is detected. The inspection system includes a rotatable disk having mask apertures that move into the line of sight of a light detector. Signals produced by scanning of timing marks upon the disk reflect which one of the plurality of masks is present in the optical path, and the photodetector determines the intensity of the transform image sampled by said mask means. The signals representing these intensities, correlated to the domain from which they emanate, are collected to form a signature for the object. This signature is compared to a known signature.