The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 1992

Filed:

Aug. 15, 1989
Applicant:
Inventor:

Winfried Lieber, Kaiserslautern, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356 731 ; 385 15 ;
Abstract

A method and apparatus for measuring the optical attenuation of optical mediums characterized by a first transmitter and a second receiver being connected to one output of the optical medium and the second transmitter and first receiver being connected to the other output. Thus, four measuring processes can be obtained, which include measuring the signal from the first transmitter after it passes through the optical medium by the first receiver, measuring the signal from the first transmitter in the second receiver before it passes through the optical medium, measuring the signal from the second transmitter after it has passed through the optical medium by the second receiver and measuring the signal from the second transmitter by the first receiver before it passes through the optical medium. These four values are then processed to determine the exact attenuation of the optical medium.


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