The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 1991
Filed:
Nov. 14, 1990
U.S. Philips Corporation, New York, NY (US);
Abstract
A plurality of electrometer probes (3, 4, 5, 6) scan charge patterns of a photoconductor (1) which is locally uniformly charged prior to the X-ray exposure and is discharged by the exposure in dependence on the intensity of the X-rays. The surface of the photoconductor is scanned after the exposure in order to determine the charge density, the electrometer probes (3, 4, 5, 6) forming for each pixel a pixel value which corresponds to the discharge at the relevant pixel to compensate for sensitivity fluctuations of the electrometer probes included is a calibration operation for the sensitivity of all electrometer probes in that two probes (3, 4, 5, 6) scan an identical section (a.sub.1 . . . d.sub.3) of the image, their relative sensitivity used for correcting the pixel values is derived from comparison of the resultant output signals of the probes (3, 4, 5, 6).