The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 1991
Filed:
Nov. 27, 1990
Yoshiharu Saito, Tokyo, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
An objective lens system for microscopes comprising, in the order from the object side, a first lens unit which has a positive refractive power, comprises a positive meniscus lens component having a convex surface on the image side and allows a diverging light bundle to emerge therefrom, a second lens unit which has a positive refractive power, comprises at least one cemented surface having a negative refractive power and is movable along the optical axis, and a third lens unit having a negative refractive power, and adapted so as to favorably correct aberrations by moving the second lens unit in conjunction with thickness of a transparent plane parallel plate arranged between the first lens unit and an object to be observed through the objective lens system. This objective lens system has a high magnification, a large NA and a long working distance.