The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 1991

Filed:

Dec. 23, 1988
Applicant:
Inventor:

George A Person, Phoenix, AZ (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K / ; H05K / ; H05K / ;
U.S. Cl.
CPC ...
364512 ; 361390 ; 361331 ;
Abstract

Spurious cavity resonance effects in a cabinet housing electronics circuitry are suppressed by determining the maximum repetition rate or frequency for legitimate signals which can appear in the circuitry and then establishing the dimensions of each cavity within the cabinet such that each cavity's resonant frequency is higher than the critical repetition rate/frequency. Since a given cavity in a cabinet is typically block-shaped (such as the space between a cabinet door and the circuit panel facing the door), a special purpose formula may be employed to obtain a good approximation of the cavity's resonant frequency, and the cavity dimensions then adjusted to raise the cavity resonant frequency above the critical frequency. For the still more particular cavity configuration in which the length is greater than the width which is much greater than the depth, a further simplified formula can be employed to find an approximate cavity resonant frequency. In addition, for the common configuration in which one or more significant intrusions reduce the cavity volume, a more complex formula may be employed to find its approximate resonant frequency with the cavity dimensions then being adjusted to raise that approximate resonant frequency above the critical frequency. The method may be employed either in the design stage or at a remedial stage.


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