The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 1991

Filed:

Apr. 12, 1990
Applicant:
Inventors:

Jinichi Matsuda, Nagaoka, JP;

Yasuyuki Kondoh, Nagaoka, JP;

Koichi Mukasa, Sapporo, JP;

Akihiro Inada, Nagaoka, JP;

Masahiro Iizuka, Sapporo, JP;

Kinya Aoyagi, Yoita, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G06G / ;
U.S. Cl.
CPC ...
324250 ; 364578 ;
Abstract

The present invention relates to a method for measuring three-dimensional spatial magnetic field distributions used particularly in measuring the magnetic field distribution in a small spatial region such as a leakage magnetic field of a magnetic head and the object thereof is a measuring method capable of measuring a high frequency magnetic field in the small spatial region with a high precision.


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