The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 1991

Filed:

Dec. 13, 1990
Applicant:
Inventors:

Danilo Re, Bernareggio, IT;

Alfonso Maurelli, Sulbiate, IT;

Assignee:

SGS-Thomson Microelectronics Srl., Agrate Brianza, IT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437 47 ; 437 43 ; 437 60 ; 437195 ; 148D / ;
Abstract

A method of manufacturing integrated circuits includes steps: forming a first layer of polycrystalline silicon on areas of a semiconductor substrate previously covered with a dielectric material; forming a first insulating layer and a second thin layer of polycrystalline silicon acting as a shield; removing the second layer of polycrystalline silicon and the first insulating layer except from predetermined areas for containing a first type of electronic component; doping the exposed portion of the first layer of polycrystalline silicon; forming, by deposition, masking and removal, of a second insulating layer on the first layer of polycrystalline silicon in an area for containing a second type of electronic component; forming of a third layer of polycrystalline silicon; masking predetermined zones of this latter layer lying at least partially above the areas intended for the two types of electronic components, and removing the polycrystalline silicon external to these predetermined zones. The method continues with conventional steps and makes it possible to obtain, for instance, EPROM memory cells and capacitors using the same polycrystalline silicon depositing steps for forming their electrodes, without dispensing with the maximum freedom and precision in the choice of the physical characteristics and dimensions of the two types of components.


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