The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 1991

Filed:

Nov. 15, 1990
Applicant:
Inventors:

Johannes G Van Endschot, Eindhoven, NL;

Cornelis M Van Doorn, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G / ;
U.S. Cl.
CPC ...
378197 ; 378196 ; 378198 ; 378193 ;
Abstract

In an X-ray examination apparatus, comprising a column, a mount which is connected to the column and which is rotatable about an axis, and a C-shaped carrier which is journalled in the mount, there is provided a friction roller which serves to drive and brake the C-shaped carrier and which bears against a contact face provided along the carrier. The carrier is thus locked in a play-free manner and can be readily adjusted by hand. Because the friction roller is journalled in a carriage which is displaceable with respect to the mount, a pressure exerted on the contact face by the friction roller is adjustable.


Find Patent Forward Citations

Van Endschot, Johannes. (1991). X-ray examination apparatus (U.S. Patent No. 5073917). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5073917

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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