The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 1991
Filed:
Aug. 28, 1989
Richard K Peters, Tallmadge, OH (US);
Donald V Elmerick, Tallmadge, OH (US);
James L Spayer, Brecksville, OH (US);
Gerald E Walter, Cleveland, OH (US);
Accuron Corporation, Cleveland, OH (US);
Abstract
A pap smear inspection apparatus and method for automated screening of cytological smears for dense, possibly malignant cells includes a specimen slide for receiving a cytological smear and a microscope for enlarging the image of the smear. The microscope is outfitted to receive a video camera for creating an analog video signal corresponding to an area enlarged by the microscope and being observed by the video camea. A video timer synchronizes operation of the smear analysis apparatus. An image window generator focuses the analysis of the apparatus on a sub-area of the entire video image. A converter is provided for converting a digital threshold level into a corresponding analog threshold level. A comparator is used for transforming the analog video input signal into a binary video signal according to the analog threshold levels. A pixel counter sums the number of ON pixels both in the transformed video signal, and within the designated window sub-area of said video signal. A microprocessor compares the digital count output with a user-defined limit on the number of ON pixels allowed to occur within each sub-area under study, and if the limit it exceeded, the current area has failed the test for acceptability.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile