The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 1991
Filed:
Mar. 30, 1990
Applicant:
Inventors:
Lester B Postlewait, Cheraw, SC (US);
Charles M Newton, Cheraw, SC (US);
Assignee:
Cooper Industries, Inc., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324713 ; 219497 ; 324602 ; 324691 ;
Abstract
A circuit and method for measuring resistance in an active and high temperature environment is provided using a low frequency square wave as an input. The square wave input is fed through the unit under test into a full-wave rectifier and RMS circuit. The full-wave rectifier and averaging circuit cancel out errors caused by the Seebeck effect and noise. The resulting d.c. signal is proportional to the resistance of the unit under test and can be displayed.
Postlewait, Lester. (1991). Resistance measurement in an active and high temperature environment (U.S. Patent No. 5073758). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5073758
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile