The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 1991
Filed:
Dec. 14, 1989
Hans R Weber, CH-1007 Lausanne, CH;
Other;
Abstract
A measurement configuration which is particularly suitable for multi-probe measurement configurations and contains at least one linear measuring probe (10) which can be connected without any supplementary electronic circuit to standard measuring instruments, computers and printers or other evaluation devices (16). A display and control unit (70) can be attached to the linear measurement probe (10) in order to monitor the measuring process at the measurement location, or to transform the linear measuring probe (10) into a dial gage with analog or digital readout. A transducer and an electronic circuit are located in a cylinder (1) in addition to the guide bush for the measuring spindle. The electronic circuit converts the signals from the transducer into normalized measuring signals which can be directly processed by an external evaluation device (16). A cable (46) with a connector contains leads for signal transmission and a duct for controlling the measuring spindle for pressure variation.