The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 1991
Filed:
Jun. 22, 1990
Applicant:
Inventor:
Gordon W Priebe, Maple Grove, MN (US);
Assignee:
Honeywell Inc., Minneapolis, MN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 731 ; 3241 / ; 324537 ; 371 151 ;
Abstract
A test system for determination of the integrity of interconnections between integrated circuits based on test circuit portions provided in such integrated circuits which are subject to signals from the inputs that might vary in value because of faulty interconnections. The values on such inputs are set, in the absence of input signals reaching them, by switchable resistances in the corresponding test circuit portions each of which can couple a predetermined signal value to a corresponding input, but which can also be overridden by signals supplied to that input across the corresponding interconnection from a source thereof.