The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 1991
Filed:
Feb. 21, 1990
Applicant:
Inventors:
Takashi Okuyama, Tokyo, JP;
Masatoshi Iwama, Tokyo, JP;
Assignee:
Asahi Kogaku Kogyo K.K., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
25022731 ; 250560 ; 356386 ;
Abstract
An optical inspection system uses a fluorescent optical fiber to receive detection light and generate fluorescent light which then travels the length of the fiber and is detected at one or both ends thereof.
Okuyama, Takashi. (1991). Optical measurement and detection system (U.S. Patent No. 5070237). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5070237
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile