The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 1991

Filed:

May. 26, 1989
Applicant:
Inventors:

Antoon F Mehlkopf, Eindhoven, NL;

Willem M Prins, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324312 ;
Abstract

An MRI method and device for fast determination of the transverse relaxation time constant T2 utilizes the fact that this time constant introduces asymmetry into all magnetic resonance echo signals (::exp(-t/T2) enabling determination of the time constant T2 from the asymmetry of the echo signals. During the determination of a spin density distribution the value of the time constant T2 can be determined for each pixel. After Fourier transformation of the resonance signal, integration of the imaginary terms is performed (in the coordinate direction of the measuring gradient). The quotient of the current integral and the real term of the associated pixel is an accurate measure of the time constant T2 in the relevant pixel.


Find Patent Forward Citations

Mehlkopf, Antoon. (1991). Mri method and device for fast determination of the transverse (U.S. Patent No. 5068610). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5068610

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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