The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 1991
Filed:
Aug. 15, 1990
Michio Kondo, Nagoya, JP;
Brother Kogyo Kabushiki Kaisha, Aichi, JP;
Abstract
An apparatus for measuring surface roughness or profile of a subject, including a truncated conical lens having a central circular flat surface and a conical surface, and an objective lens disposed in series with the truncated conical lens. Parallel rays of light are transmitted through the truncated conical and objective lenses and are thereby converted into a first and a second measuring beam for irradiating respectively a minute spot on the surface of the subject and an annular spot surrounding the minute spot. An optical arrangement is provided for preparing a reference beam whose frequency is different from that of the measuring beams, and effecting interference between the reference beam with each of the first and second measuring beams, to produce two beat beams, which are converted into electrical beat signals. A height variation or roughness of the subject surface is determined based on a phase difference between the two beat signals.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile