The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 26, 1991
Filed:
Aug. 13, 1990
Abstract
An apparatus for measuring the duration of single short optical radiation lses, particularly laser radiation pulses, by means of autocorrelation and two-photon ionization, contains a Mach-Zehnder interferometer (BS1, BS2, M1, M2) as beam splitter means for generating from a single input radiation pulse (10) two coherent component pulses (14, 16) propagating along two component beam paths (18, 20) each of which contains a section (18a20a) passing through a meausring zone (22) where they overlap, further a two-photon ionization detector having a measuring zone (22) and collector electrode means (36) and counter-electrode means (38) at which an electric output signal is available depending on the number of charge carriers generated in the measuring zone when the component beam pulses overlap, and a measuring system connected to the electrode means (36, 38). The collector electrode means (36) contains a number of strip-type collector electrodes which are to each other and electrically separated from each other and are located in a plane essentially parallel to the two component beam paths ( 18a, 20a) in the measuring zone and are oriented in the longitudinal direction essentially in the direction of the component beam path sections (18a, 22a) passing through the measuring zone (22).