The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 1991
Filed:
Jan. 30, 1990
Kamran Firooz, Loveland, CO (US);
Hewlett-Packard Company, Palo Alto, CA (US);
Abstract
Disclosed is a test system having an arbitrary waveform generator, a comparator, and a test controller to analyze the arbitrary signal output from a device under test. The output of the device under test is connected to one input of the comparator and the output of the arbitrary waveform generator is connected to the other input of the comparator. The test controller stimulates the device under test, causing it to perform a function, and stimulates the arbitrary waveform generator, causing it to generate a limit envelope signal. The output of the comparator is continuously monitored by the test controller to determine whether the signal output of the device under test exceeds the limit envelope created by the arbitrary waveform generator.