The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 1991

Filed:

Aug. 29, 1989
Applicant:
Inventor:

John P Schwenker, Boulder, CO (US);

Assignee:

Hyperfine, Inc., Boulder, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356328 ; 356334 ;
Abstract

An improved method and apparatus for focused stigmatic imaging with spherical concave diffraction gratings incorporates a concave spherical diffraction grating with parallel, normally ruled lines. An entrance light beam source or projector propagates a beam of light to be analyzed through an entrance point and onto the surface of the diffraction grating. A light detector or analyzer is positioned at or near a detection point for detecting or characterizing the light diffracted from the grating. The entrance point and detection point are positioned in spaced-apart relation to each other and to the grating according to disclosed formulae, such that they are in respectively corresponding stigmatic or near stigmatic focus with each other.


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