The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 1991
Filed:
Jan. 11, 1991
Jun Makino, Yokohama, JP;
Masamichi Tateoka, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
The present invention relates to a scanning optical system and a scanning optical apparatus in which the pivot axis and the mirror surface of the deflector are inclined to have a predetermined relationship so as to obtain practical planeness of a surface to be scanned. A scanning optical system according to the present inhvention comprises a light source, lens for converging a light beam from the light source and a deflector for deflecting the light beam in a predetermined direction. In the optical scanning system according to the present invention, the maximum deflection angle of the deflector, a relationship between a radius of curvature of the deflection/reflection surface of the deflector and a distance between an object point of a light beam incident on the deflection/reflection surface of the deflector and the deflection/reflection surface for reflecting a central ray of the incident light beam, are determined to satisfy with a predetermined condition. And further, a relationship between an angle defined by a predetermined pivot axis of the deflector and the deflection/reflection surface of the deflector and an incident angle of the light beam from the light source to the deflection/reflection surface of the deflector within a plane including the predetermined axis and perpendicular to the deflection plane when the light beam emerging from the deflector is present within a single plane, is determined to satisfy with a predetermined condition.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile