The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 1991
Filed:
Oct. 11, 1990
Applicant:
Inventors:
Mitsuhiro Koike, Kanagawa, JP;
Shusou Wadaka, Kanagawa, JP;
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G06F / ;
U.S. Cl.
CPC ...
73602 ; 73625 ; 73642 ; 36472807 ; 364821 ; 367100 ; 367905 ;
Abstract
An ultrasonic flaw inspecting apparatus is provided in which the transmission signals comprising N number of the binary code sequences having sharp autocorrelation functions are input to an object to be inspected by a single transducer for transmission and the reflected signals are received by N number of transducers for reception. The N number of transducers for reception are connected and placed over each other so that the direction of respective polarization is inverted in terms of the time order of the binary code of the sequence.