The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 1991
Filed:
Mar. 29, 1990
Applicant:
Inventors:
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ;
Abstract
A testing method and apparatus by use of nuclear magnetic resonance measure, at timings influenced and not influenced from chemical shift, nuclear magnetic resonance signals taken from a sample to be tested at least one of whose values of permeability and chemical shift is known and a reference sample both of whose values of permeability and chemical shift and their spatial distribution are uniform thereby to acquire four items of image vector information. Further, the testing method and apparatus take phase differences between the items of image vector information to separately extract the phase component influenced by the permeability distribution and the phase component influenced from the chemical shift.