The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 1991

Filed:

May. 31, 1990
Applicant:
Inventors:

Chiayu Ai, Tucson, AZ (US);

John B Hayes, Tucson, AZ (US);

Assignee:

Wyko Corporation, Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356153 ; 356363 ;
Abstract

A method and apparatus is disclosed for aligning a reflective surface with an alignment axis in a representative environment of an interferometer. An image of the reflective surface is focused onto a diffuse screen to form a spot image thereon. Rays of the spot image emanating from the diffuse screen are collimated. Some of the collimated rays are focused onto a detector to form a non-inverted image spot. A portion of the collimated rays are intercepted and inverted by means of an image inverter aligned with the alignment axis. The inverted rays are focused onto the detector to form an inverted image spot. The reflecting surface is moved so as to cause the inverted image spot and the non-inverted image spot to coincide, at which point the reflecting surface is aligned with the alignment axis.


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