The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 1991
Filed:
Jun. 06, 1989
Dwight L Jaggard, Newtown Square, PA (US);
Nader Engheta, King of Prussia, PA (US);
The Trustees of the University of Penn., , PA (US);
Abstract
Methods of measuring chiral parameters of chiral materials with chiral antennas are provided. These methods involve the use of parallel electric and magnetic dipoles to construct a point sensor in conjunction with the use of a turnstyle antenna as a source. By exciting the chiral medium with the turnstyle antenna, both the absolute degree of chirality and the handedness of the chiral medium can be measured by varying the output currents of the point sensor until a null is achieved. This condition indictes that the ratio p/m, where p is the magnitude of the electric dipole moment and m is the magnitude of the magnetic dipole moment, of the point sensor is .+-.i/v.sub.c. From this relation and knowledge of the relation of permittivity and permeability, the absolute value of the chiral admittance and the chirality factor of the medium can also be found.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile