The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 1991
Filed:
Feb. 12, 1990
Steven H Peterson, Wyoming, MI (US);
Timothy R Friend, Jenison, MI (US);
X-Rite, Incorporated, Grandville, MI (US);
Abstract
A densitometer apparatus (210) is disclosed and is adapted to provide color density measurements of object samples. The densitometer apparatus (210) comprises a source light (578) for projecting light toward an object sample comprising a control strip (588, 620). A reflection optics assembly (576) is adapted to measure light density reflected from the object sample, when the object sample is in the form of a paper control strip. A transmission optics assembly (618) is adapted to measure transmission density of light rays projected through the object sample, when the object sample is in the form of a film control strip. A motor assembly (426) automatically moves the object sample (588,620) through the apparatus (210) adjacent the source light (578). Pattern definition data is prestored in memory of the apparatus (210). When control strips (588, 620) to be analyzed are 'read' through the apparatus (210), a pattern recognition process is employed to compare strip color patches with the prestored data, so as to determine whether the control strip 'matches' the pattern definition. The pattern definition data is stored so as to define 'regions' where dimensional, positional and spectral color patch properties are within predetermined tolerances. An initial step of the pattern recognition process is to scan measured data representative of the control strip and assign regions. Comparisons of the pattern definition region data and measured control strip region data are then performed to determine whether an appropriate 'match' has been obtained.