The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 1991

Filed:

Feb. 02, 1990
Applicant:
Inventors:

Roger W Wong, Santa Rosa, CA (US);

Hugo Vifian, Santa Rosa, CA (US);

Michael G Hart, Windsor, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356 731 ;
Abstract

A lightwave component measurement system provides modulation measurements and the use of digital signal processing for the resolution of single or multiple optical reflections in optical fiber cable or in open beam at discontinuities attributable to changes in the effective index of refraction in an optical transmission medium. The lightwave component measurement system preferably incorporates a transform capability that converts data measured in the modulation frequency domain to the time or distance domain. The time-domain data are both stable and accurate, since they are calculated from highly-stable, highly-precise frequency-domain information. The time-domain transform capability in the lightwave component measurement system allows a reflection to be located to millimeters, and resolution of multiple discontinuities just centimeters apart. This also enables precise measurement of the magnitude and distance to each discontinuity, as well as the length of an optical transmission medium, such as optical fiber cable. The lightwave component measurement system in accordance with the invention has a broad measurement dynamic range (typically 45 dB) with no measurement dead zones.


Find Patent Forward Citations

Wong, Roger. (1991). Method and apparatus for measuring the length of, or distances to (U.S. Patent No. 5062703). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5062703

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