The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 1991

Filed:

May. 07, 1990
Applicant:
Inventor:

George A Zivley, Houston, TX (US);

Assignee:

ESM International, Inc., Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C / ;
U.S. Cl.
CPC ...
209581 ; 209586 ; 209587 ;
Abstract

A sorting machine is disclosed in which the viewing window is electro-optically observed using an array of photodetectors, each observing a photo site or pixel of the viewing window. Such detection allows for normalizing by photo site viewing to individually account for background and photodetector sensitivity differences from photo site to photo site. Such detection also provides for detecting a series of defects existing for each photo side and, thus, rejecting products that have a larger than acceptable number of successively detected defective photo sites. Also disclosed is a circuit for rejecting a defective product based on sensing where its trailing edge is or should be if covered up by a successive overlapping product. Such detection also allows for rejecting products that are either too long or too short. All of this is done by digital processing resulting from the digitizing permitted by photo site detection.


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