The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 1991
Filed:
Jul. 12, 1989
501 Toray Industries, Inc., Tokyo, JP;
Abstract
A method of measuring a profile of an object wherein an ultrasonic wave is radiated from an ultrasonic transducer toward an object supported by a supporting member in the water filled in a water tank, and a wave reflected at the surface of the object is detected by the transducer, and an apparatus for carrying out the method. A traversing device moves the transducer sequentially to a plurality of measurement points on an arc equidistant from a predetermined rotational center while opposing the transducer to the predetermined rotational center. A supporting device moves the supporting member relative to the transducer and sets the object in the predetermined position under water. A control device delivers a drive signal to the traversing device to move the transducer sequentially to the measurement points, causes the transducer to radiate an ultrasonic wave when the transducer is in each of the measurement points, calculates a distance between the transducer and the surface of the object in accordance with a difference between the time the transducer radiates the ultrasonic wave and the time transducer receives the wave reflected at the surface of the object, calculates coordinates of each of the measurement points, and coordinates of the surface of the object corresponding to each of the measurement points from the calculated distance, and obtains the profile of the object from the calculated coordinates of the surface of the object at each of the measurement points.