The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 1991

Filed:

Jul. 12, 1989
Applicant:
Inventors:

Naoomi Miyagawa, Gifu, JP;

Chiyoaki Yoshida, Aichi, JP;

Kazuyuki Toda, Aichi, JP;

Yukiyasu Nakamura, Aichi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21D / ;
U.S. Cl.
CPC ...
72 10 ; 72389 ; 72 31 ;
Abstract

A press brake having a lower die disposed in a horizontal position and an upper die movable in up and down directions out of and into workpiece shaping relationship with lower die for shaping a workpiece, at least one workpiece measuring portion provided on the lower die, at least one workpiece measuring device at the workpiece measuring portion, the workpiece measuring device having probes movable in up and down directions for contacting the shaped portion of the workpiece which is in the lower die, a workpiece contacting portion on each of said probes for contacting said workpiece as the probes are moved upwardly in said lower die, and a displacement detecting device connected to the workpiece measuring device for detecting relative displacement in the up and down directions between the probes as the probes respectively engage the workpiece. The lower die can be formed of a plurality of unit lower dies with spaces therebetween forming the workpiece measuring portion and in which the workpiece measuring device is positioned. The structure enables a shaped workpiece to be measured while it is still between the dies.


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