The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 1991
Filed:
Jun. 19, 1989
Tamiki Takemori, Shizuoka, JP;
Hamamatsu Photonics Kabushiki Kaisha, Shizuoka, JP;
Abstract
A deformation measuring method and device in which an object is irradiated with a laser beam before and after deformation of the object to obtain speckle patterns, the speckle patterns thus obtained are photoelectrically converted into electrical signals, and the cross-correlation function between the speckle patterns is calculated using the electrical signals to obtain displacement of the speckle pattern on the basis of the shift of position of the extreme value of the cross-correlation function and to determine the amount of deformation of the object from the displacement of the speckle pattern. Each of photosensitive elements for converting the speckle patterns into the electrical signals has a rectangular form of a large ratio of a long side to a short side and a photosensitive element array comprising the photosensitive elements has a comb structure in which the photosensitive elements having the above structure are arranged in a strip form.