The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 1991
Filed:
Dec. 17, 1990
Pierre H Nys, Berchem, BE;
Agfa-Gevaert N.V., Mortsel, BE;
Abstract
A measuring strip for evaluating the quality of photographic half tone images which contains on a transparent base a test field (F) divided into at least two sub-fields, wherein (1) a first sub-field (F.sub.1) contains a plurality of individual areas each containing a group of opaque dots, wherein each individual area has dots of substantially equal size uniformly distributed in a transparent background area, and wherein (2) a second sub-field (F.sub.2) contains a plurality of individual areas each containing a group of transparent dots of substantially equal size uniformly distributed in an opaque background area, and wherein in each individual area containing (opaque or transparent) dots having substantially the same dot size the dots are at substantially equal distance from each other measured center-to-center and the dots are graduated in size in the areas of each said sub-field so that an area containing dots of smaller size contains more dots than an area containing dots of larger size, and wherein the light transmission of said first and second sub-field expressed as a percentage is different by at least 10%.