The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 1991

Filed:

May. 19, 1989
Applicant:
Inventors:

Willem P Van Der Brug, Eindhoven, NL;

Jan Timmer, Eindhoven, NL;

Petrus N Vis, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K / ; G21K / ;
U.S. Cl.
CPC ...
378 20 ; 378 10 ; 378 24 ; 378 21 ; 378 25 ;
Abstract

A computer tomography system includes an X-ray tube having an elongate anode across which a beam spot can be displaced, a scanogram being formed by correctly shifting the profiles measured in the various source positions with respect to one another, followed by superposition. Parts of the object which are situated in a selected layer are thus emphasized in an image, parts of the object which are situated outside the selected layer being blurred. When a point of interest in the object is determined by observation of the scanogram, the same apparatus is used to produce a tomography slice image transverse the scanogram image. An important additional advantage consists in that the permissible power to be applied to the X-ray source may be higher. Furthermore, a scanogram thus obtained is not necessarily disturbed by the failure of one or more detectors.


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