The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 1991
Filed:
Sep. 26, 1988
Applicant:
Inventors:
Assignee:
Max Planck Gesellschaft zur Forderung der Wissenschaften E.V., Gottingen, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 8211 ; 422 83 ; 422 91 ; 359123 ; 359141 ;
Abstract
An arrangement for optical measuring concentration of substances has a measuring space which is composed of a material selectively permeable for particles to be measured, acting back on the particles and transparent for a measuring radiation, and a measuring space is arranged in working connection with the object to be measured and the measuring radiation passes through the measuring space. The measuring space has a layer that is a water-insoluble solvent or made of poly(ethylene terephthalate) or polytetrafluoroethylene. The layer excludes a reaction from the particles to be measured.