The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 1991

Filed:

Jul. 12, 1990
Applicant:
Inventor:

Kunio Shimauchi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G / ;
U.S. Cl.
CPC ...
73 / ;
Abstract

Method and apparatus for calibrating the sensitivity and linearity of the weighing means of an electronic balance, wherein a sensitivity calibration is automatically conducted when the ambient temperature has changed a first predetermined amount or a predetermined period of time has passed since the previous calibration was conducted, and when a sensitivity calibration is conducted, it is checked whether or not the temperature change has exceeded a second predetermined amount greater than the first predetermined amount, and only when the temperature change has exceeded the second predetermined amount since the previous linearity calibration was conducted, a linearity calibration is conducted along with the sensitivity calibration.


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