The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 1991

Filed:

Feb. 06, 1989
Applicant:
Inventors:

Paolo Cielo, Montreal, CA;

Marc Dufour, Montreal, CA;

Mario Lamontagne, Longueuil, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356376 ; 356-1 ;
Abstract

An optical inspecting apparatus and the method thereof, including a series of optical units for rapidly acquiring the three-dimensional surface profile of a moving object. Each optical unit contains a multiple-beam light source to project a number of luminous spots on the object surface which are imaged through a properly oriented line-array camera. The surface position on both sides of the object, and thus the object thickness, is inferred at the position of each luminous spot from an analysis of their camera image. The projected luminous spots are preferably elliptically shaped and the line array elements are elongated in a direction perpendicular to their longitudinal axis in order to reduce speckle and other optical noise. The described optical configuration results in a superior performance in terms of spatial resolution and response speed.


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