The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 1991

Filed:

Mar. 03, 1989
Applicant:
Inventors:

Steven E Bott, Conway, MA (US);

Harry R McKinley, Southampton, MA (US);

W Howard Hart, Amherst, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356336 ; 356343 ;
Abstract

Methods and apparatus for measuring the intensity of light scattered by particles suspended in a sample volume illuminated by an interrogating light beam directed along an input axis, utilizing plural Fourier optical systems having lenses arranged for illuminating multiple photodetectors. The lenses of each Fourier optical system can be of different optical powers, for providing low power and high power optical trains. A low power optical train provides high resolution measurements of light scattered within a small angular range at low angles relative to the input axis, while a high power optical train provides lower resolution measurements of light scattered within a larger angular range at higher angles.


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