The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 1991
Filed:
Aug. 24, 1990
Keiji Kawasaki, Nagoya, JP;
Koji Fushimi, Gifu, JP;
NGK Insulators, Ltd., Nagoya, JP;
Abstract
An ultrasonic testing method for detection of flaws in a material to be tested having a curved surface portion by use of an ultrasonic probe, wherein a center axis of curvature of the curved surface portion of the material to be tested and the center axis of the probe are set in an eccentric relationship so that the angle of refraction of an ultrasonic wave is 90.degree., and the probe comprises a tip portion having a curved surface of the same kind as the curved surface portion of the material to be tested and a radius of curvature of from 1.0 to 3.0 times the radius of curvature of the curved surface portion of the material to be tested. The method enables detection of internal flaws in, particularly, a spherical or cylindrical body formed of a ceramic and used as a bearing member.