The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 1991
Filed:
Feb. 06, 1989
Shigeru Furuta, Itami City, JP;
Kenichi Takahira, Itami City, JP;
Atsuo Yamaguchi, Itami City, JP;
Takesi Inoue, Itami City, JP;
Toshiyuki Matsubara, Itami City, JP;
Shuzo Fujioka, Itami City, JP;
Abstract
A memory system storing data detects and corrects an error in the stored data. The memory device includes a coding circuit for generating a systematic code including a data word and an error checking and correcting (ECC) code when the data word is supplied from a data bus during data writing, a memory cell array for storing the systematic code, and a sense amplifier for reading the systematic code from the memory cell. An error checking and correcting system generates a syndrome from the systematic code, decodes the syndrome to determine whether an error exists, identifies a bit position at which an error has occurred, and corrects the error contained in the data word by inverting a bit of the data word in the position at which the error has occured. The system includes a multiplexer for outputting the corrected data word to the data bus and a code reading circuit, for example, an ECC code register, for reading the ECC code generated by the coding circuit directly into the data bus. With this arrangement, it is possible to immediately and independently check the function of the coding circuit without influence from the memory cell array.