The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 1991
Filed:
Jun. 28, 1989
Applicant:
Inventors:
Akira Morimoto, Tokyo, JP;
Akira Ohwaki, Tokyo, JP;
Assignee:
Asahi Kogaku Kogyo Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
2502014 ; 250235 ; 359662 ; 359663 ; 359206 ;
Abstract
An optical scanning system has a deflector for deflecting a beam emitted from a light source portion, a telecentric scanning lens for focusing the deflected beam onto a scanning surface, a beam splitter for splitting a beam reflected by the scanning surface on an optical path between the deflector and the light source portion from an outgoing optical path, and a focus point detector for receiving the beam split by the beam splitter and detecting a focused state of the beam on the scanning surface.