The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 1991
Filed:
Apr. 16, 1990
Muneharu Ishikawa, Ryuugasaki, JP;
Ayafumi Taniji, Tsukuba, JP;
Kowa Company Ltd., , JP;
Abstract
A method and apparatus for measuring the velocity of a fluid in which a double-exposure image of the speckle pattern or particle images of tracer particle in a fluid is irradiated with a collimated beam of coherent light, and is subjected to Fourier transformation to produce Young's fringes at its focal plane. A slit is rotated relatively with respect to the double-exposure image to produce changes in the amount of light transmitted by the slit and determine the direction of the fringes. To determine the spacing of the fringes, a variable-spacing grating filter is used which is complementary to the image of the fringes and has a transmission distribution function of sin.sup.2 or cos.sup.2. The thus obtained direction and spacing of the fringes are used to determine the velocity of the fluid.