The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 1991
Filed:
Feb. 02, 1990
Applicant:
Inventor:
Richard H Clarke, Scituate, MA (US);
Assignee:
Boston Advanced Technologies, Inc., Boston, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; G01N / ;
U.S. Cl.
CPC ...
128633 ; 356 39 ; 25022723 ;
Abstract
Systems and methods for non-invasive material analysis are disclosed in which a material (e.g., a liquid such as blood) is illuminated at a plurality of discrete wavelengths. Measurements of the intensity of reflected light at such wavelengths are taken, and an analysis of reflection ratios for various wavelengths is performed. Changes in the reflection ratios can be correlated with specific material properties such as the concentration of analytes (e.g., oxygen content, glucose levels, cholesterol or drugs in a subject's circulatory system).