The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 1991
Filed:
Apr. 04, 1989
James E Hubbard, Jr, Derry, NH (US);
Shawn E Burke, North Reading, MA (US);
The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);
Abstract
The present invention is a device for characterizing pressure distributions on a rigid surface with respect to at least one reference (x) axis. The device includes a substrate electrode disposed on the rigid surface for which the pressure distribution is to be characterized. An electrically conductive material may form the substrate electrode, or where the rigid surface itself is electrically conductive, that rigid surface may form the substrate electrode. A piezo film is disposed on and overlying the rigid surface. A sensor electrode is disposed on and overlying at least part of the piezo film. In one form of the invention the sensor electrode of a measurement cell is a composite electrode including at least two electrically isolated portions. One portion has a dimension transverse to the reference axis which varies in proportion to position (x) along the reference axis, and the other portion has a dimension transverse to the reference axis which varies in proportion to one minus position (1-x) along the reference axis.