The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 1991
Filed:
Mar. 31, 1989
Applicant:
Inventor:
Akihiro Nomura, Kyoto, JP;
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358458 ; 358455 ; 358456 ; 382 54 ;
Abstract
Highlight density (X.sub.H) (or shadow density) is established on the basis of a cumlative histogram (H(X)) of density of an original. Computed first are reference densities (X.sub.HR, X.sub.HL and X.sub.Hl -X.sub.Hn) associated with prescribed reference statistic values (Y.sub.HR, Y.sub.HL and Y.sub.Hl -Y.sub.Hn), respectively, and threshold values (W.sub.Hl -W.sub.Hn). Then, the reference density (X.sub.HR) is compared with a prescribed threshold density (X.sub.HS), and a difference (X.sub.Hi) concerning the reference density (X.sub.Hi) is compared with the threshold value (W.sub.Hi) in a procedure, to thereby select one of procedures for establishing the highlight density.